Piezoelectric crystal apparatus



May 30, 1950 F. CAROSELLI 2,509,473

PIEZOELECTRIC CRYSTAL APPARATUS Filed May 10, 1948 4 Sheds-Sheet 1 INl/ENTOR By FCAROSELL/ ATTORNEY y 30, 1950" F. CAROSELU' 2,509 418 PIEZOELECTRIC CRYSTAL APPARATUS Filed May 10, 1948 4 Sheets-Sheet 2 wa fivmu A 7' TO/PNE l May 1950 F. CAROSELLI 2,509,478

PIEZOELECTRIC ('JRYS'IAL- APPARATUS Filed Mag 10, 1948 4 Sheets-Sheet 3 H54 TING CURVE I n l 1 50 '40 3O 2O IO IO 4-0 6O 8O 9O TEMPERATURE IN DEGREES CENT [GRADE INVENTOR y F. CAROSE LL A TTO/PNEV y 1950 F. CAROSELLI 2,509,478

PIEZOELECTRIC CRYSTAL APPARATUS Filed May 10, 1948 4 Sheets-Sheet 4 g k u g E 4 x (CMSTAL OUARTZ) 2 8 20 (CRYSTAL own-r2) :43 (CERAMIC) LEGEND:

XO- QUARTZ ELECTRODES WITH LANDS AL 0N6 Fae (cs/mum) 8 E 2 m x M15. g 20- QUARTZ ELECTRODES 1 WITH uwos ALONG w j z AXIS. g i 24.1-ALS/MAG 24: F66-STEA 7'/ TE F66 E g ruse-o oumrz -|o 55 E l2 3 -1 4 l l l I ll I no 20 so 40 so so so so ANGLE B 11v 050x555 ruse-0 aumrz nrcrnons I 3 'ccnAM/c res sucmoae E E mun/c 243 EL scmobs S Q l l' e a E Z0 ELECTRODE INVEN roe smamzxem By F. CAROSELL/ IO so so 10 so W ANGLE (3 IN DEGREES ATTOFWEV x0 ELECTRODE Patented May 30, 1950 UNITED STATES PATENT OFFICE Telephone Laboratories,

Incorporated, New

York, N. Y., a corporation of New York Application May 10, 1948, Serial No. 26,013

17 Claims.

This invention relates to piezoelectric crystal apparatus and particularly to arrangements adapted for mounting a piezoelectric crystal body in such a manner that clamps or other rigid stays are utilized. in fixed contact relation with respect to the surface of the piezoelectric crystal body and restrain its freedom to vibrate in piezoelectric response, in such a mode of motion, for example, as the high frequency harmonic thickness mode required of crystal elements for use as frequency determining circuit elements in high frequency oscillation generator systems and electric wave filter systems.

One of the objects of this invention is to improve the frequency stability of piezoelectric crystal units.

Another object of this invention is to provide improved mounting arrangements for a piezoelectric crystal body.

Another object of this invention is to control the temperature-frequency characteristics of a piezoelectric crystal body.

Another object of this invention is to render a clamped or pressure-mounted piezoelectric crystal body substantially free from frequency changes resulting from frictional slipping forces applied to the crystal body by its contiguous clamping means, as produced by ambient temperature changes applied thereto.

Another object of this invention is to render a piezoelectric crystal body substantially free from frequency changes resulting from the action of rigid stays fixed to the surface of the crystal body in such a manner as to restrain the crystal body from vibrating freely in piezoelectric response as the rapidity of changing the temperature of the crystal apparatus is varied.

Another object of this invention is to reduce th frictional slipping force between a crystal body and its clamping means.

In piezoelectric crystal units such as those employing a quartz crystal element as a circuit element, the crystal electrodes are used to provide the electric coupling between the associated electrical circuit and the piezoelectric crystal body by impressing upon the piezoelectric body the voltage that is necessary to drive it in vibration. It is generally desirable that the mounting arrangements have little or no adverse effect on the desired mode of vibration of the piezoelectric crystal plate and that they be designed to retain the inherently high frequency stability of the piezoelectric crystal plate itself.

The mounting members for the quartz crystal element may be composed of similar plates of insulating material such as circular-shaped ceramic, glass, or crystal quartz discs having substantially fiat and parallel major surfaces, the inner surfaces being provided with raised metallic coatings or lands disposed at or near the peripheral or marginal edges of the inner major surfaces of the pair of mounting members, with the raised clamping lands resting against the major faces of the piezoelectric quartz plate adjacent the periphery thereof to spacially separate the inner surface of the mounting member from the surface of the quartz crystal element The crystal electrodes may be of the air-gap type in which a pair of central field-producing electrodes are spacially separated from the quartz element by a very small air-gap, which may be of the order of 2 to 20 microns, for example.

The central electrode area may be obtained by means of a metallic coating centrally disposed on the inner major surfaces of the insulating mounting members and separated from the peripheral lands upon the mounting members. The relative thickness of the peripheral coatings of the raised lands with respect to the thickness of the central coatings forming the electric fieldproducing electrodes, determines the air-gap spacing between the piezoelectric crystal plate and the central field-producing coatings referred to, the crystal plate being clamped adjacent to its periphery between the raised clamping lands or risers by means of suitable spring means resiliently holding the crystal and electrode assembly in compression.

The crystal electrodes may also be of the plated type in which a pair of field-producing electrodes are plated as central metallic coatings directly upon the surface of the crystal element. In such a case, the only coatings upon the mounting members used to clamp the piezoelectric crystal plate is the peripheral raised lands, having a thickness such that the surface of the mounting members is spacially separate from the surface of the metallic electrode disposed upon the surface of the crystal element.

This invention is not directly concerned with the manner of providing the metallic coatings that form the central oppositely disposed fieldproducing electrodes and accordingly any suitable means whereby central field-producing electrodes are provided will sufiice for the objects of this invention. Hereinafter, whenever insulating mounting members are utilized in connection with the description of the features of this invention, it may be assumed that electrodes of the air-gap type are used and that the mounting members are electroded.

A difficulty experienced heretofore when utilizing piezoelectric crystal elements in practical systems has been that the temperature-frequency characteristic curve not repetitious exactly and often takes a form much like a hysteresis loop when plotted in the form of a temperature-frequency curve through a complete increasing and decreasing temperature cycle, This form of temperature instability is due to difference in the thermal expansions of the materials held in contact with thequartz orother piezoelectric crystal body. The instability appears in two forms and depends on the magnitude of the flow of heat into the crystal unit and on the direction of the flow of heat as to whether the crystal. unitaisbeing heated or cooled by virtue of the flow of heat, or on both the magnitude and. direction. An instability in frequency due onlytotheyeversal of the direction of flow of heat into the cation of a previous complete increasing and:de-

creasing temperature cycle.

Frequency: instability of the first kind is ex:- perienced when it is found that the temperature,- frequency characteristic curve obtained: during cooling;of-the-crystal unit is shifted in frequency from; the temperature-frequency characteristic curverobtained during heating-of; the crystalrunit and'athat the two; curves, heating: and: cooling, appear-alike inform.

The'firstkind of" frequency instability is due to airelativedisplacement of the area of contact be:- tweenthe mounting members and; the piezoelectric-crystalbooly that is due to differential thermalchanges' in'the dimensionsof the mounting .members.relative to the changes in the dimensions ofipiezoelectriccrystal body; The-differential .thermal' effect causes. a slipping. frictional force to exist at the-point of contact betweemthe mounting members and the piezoelectric: crystal body whichslipping force places a restraint upon theifreedomof vibration of the piezoelectric crystal bodys in piezoelectric response to an electric potential.

The second .kind of frequencyrinstability is due also to the differential thermal changes. in the dimensions of the mounting members relative'to the change in the dimensions of'the piezoelectric crystal body. The force resulting from the change causes frequency instability to= appear only when its magnitude is changed as the rate of flow of heat ischanged in magnitude but not indirection.

This second kind of frequency instability is-also present when the clamping forces remain'rigid or fixed upon the surface of the piezoelectric crystal body and there is no slipping or--relative displacementat .the point of attachment of the mountingmembers. In-such a case, the fi'owof heatxintozthecrystal unit will cause differential changes Lin dimensions of the mounting members with respect to the changes in the linear-dimen sions of the piezoelectric crystalbody. Thedifferential changes will vary as the rapidity of .supplying fheatitosthe crystal unit varies so that on plottingza temperature-frequency characteristic theplotrobtained will reflect the actual rate at which-,rthe temperature of the piezoelectric crystalbody-is: changing as well as the effect of the forces-imposed on the piezoelectriccrystal body duewto-the particular value of: the differential "crystal-body: tained': by a: clamping pressure, slipping is likely changes in dimensions of the piezoelectric crystal body and the mounting members. The frequency-temperature characteristicobtained for any'portion ofthe complete increasing and decreasing temperature cycle will not retrace exactly over a previous measurement of that portionof the frequency-temperature characteristic curve unless the rate of change of temperature of allimembers o'fthe crystal unit change in the same'manner for both measurements of the same portion of the" complete increasing and decreasing frequency-temperature cycle. The characteristics of the frequency instability of the second kind that distinguishes it from the first is that with unlike rates of heating over the same portion: of the complete increasingrand decreasing cyclerunlikezforceswof restraint are imposed'iupon the-freedom of vibration 'offthe piezoelectric crystal body as it"vibrates in= piezoelectricsresponse Ito anelectricfi'eld.

The frequency instability of: the kind is 'only-rmanifest when the 'differential'forces-upon 'the piezoelectric crystal .bOdYf'fil'B' associated: with slipping at the point of contact of-rtherzmounting members in" association with the piezoelectric If the point of contact'is mainto occur; and-the: first. kind; of temperature; instability, may. appear in the complete temperatureefrequency cycle. If the point of contact is rigid such as in the case of cementedawires to the surface of the;piezoelectric crystal :body;.only

.the :seoond: kind of frequency instability will occur. Another distinguishingcharacteristic isthat .thefrequency instability. of the first k'indyincludesalsoand'is-inherently associated with frequency instability of the secondkinduwhile in the case of fixed; points of attachment" of the mounting. members, to the I piezoelectric. crystal :body,=.there can bezno slippingand only the sec:-

ondhind; of instability can occur.

Another distinguishing characteristic of the frequencyinstability of thefirstkind is'that it occurs only when the. direction: of heating or algebraic signassociatedrwith the flow-of; heat isireversed: Immediately; on reversahoftem'eperaturefrom heating to cooling, or vice versa,

the frictional forces.- become immediately zero and the frequency of the piezoelectric crystal bodyyimmediately shifts or drifts to the value at which the differential thermal forces upon the piezoelectric crystal body are zero. This sud.- denx and precipitous change in frequency occurs immediately on arresting the flow of heating and causing a reversal .of the flow, and withoutany apparent change in" temperature of the piezoelectriccrystal body. As the-reversed direction heating is continued in application to'chan'gethe temperature of the crystal unit, the differential thermal changes cause the frictional forces to againgbuild, up but in reverse" direction to their formendirection and the frequency of the piezoelectriccrystal body shiftsfurther inthe direction-*away from the value. it had just before the reversal :of temperature was effected. The added shift or continued drift of the frequency is more'gradual than first occurred on reversal of temperature and depends on the rate of flow of heatinto the unit. When therslipping force assumes'the maximum value it may attainunder the conditions imposed by the spring clamping .forces-andithe polish or coefficientzof friction-of the material ofjthe mounting member in contact with thespiezoelectric crystal body, the frequency shift: due to changing slipping forces ceases. and

the temperature-frequency characteristic assumes the shape of a typical heating or cooling curve for the particular piezoelectric crystal body and its steady state mounting effects.

Another distinguishing characteristic of the instability of the first kind is that it only occurs on reversal of the flow of heat and only when the forces associated with the stays of the mounting members in contact with the piezoelectric are slipping frictional forces which depend on actual relative displacement of the contacting areas of the mounting members and the piezoelectric crystal body.

The hysteresis loop appearing for the complete frequency-temperature cycle may be divided into portions for which the temperature instability is only that of the first kind, and temperature instability that is only of the second kind and temperature instabilities that are due to the combined effect of both kinds. The portions are distinguished by the magnitude and direction of flow of heat into the unit. For portions for which the flow of heat is suddenly reversed, the immediate eifect is a temperature instability of the first kind and the frequency of the piezoelectric crystal body shifts with no change in temperature; as the reversal of heat flow continues the temperature reverses and increases in the reverse direction and the frequency shift continues until the frequency instability of the first kind assumes its maximum value. The frequency drift ceases and the temperature" frequency characteristic of the crystal unit assumes either its typical heating or cooling curve.

As flow of heat remains constant and unidirectional there is no apparent frequency instability, but as the rate of flow of heat is varied and its direction remains unchanged, a frequency instability occurs that is associated only with the magnitude of the flow of heat. instability of the second kind.

It has been difiicult heretofore to utilize in practical systems the higher order mechanical overtones of a thickness shear mode piezoelectric quartz crystal element with a desired high a;

degree of frequency stability, as a result of frequency changes introduced from temperature changes. Due to differences in thermal expansions of the materials held in pressure contact with the quartz or other vibratory piezoelectric crystal body, the frequency characteristic of the clamped type of piezoelectric crystal unit may be affected by the nature of the mounting arrangements in such a manner as to produce changes in the frequency characteristic with changes in the ambient temperature depending upon the direction of the temperature gradient applied thereof, and resulting in a temperature-frequency characteristic that looks much like a hysteresis loop when plotted in the form of a temperature-frequency curve through a complete increasing and decreasing temperature cycle. Such frequency instabilities with changes in the flow of heat into the crystal unit may be remedied in accordance with this invention.

In accordance with one feature of this invention, a piezoelectric crystal body, such as an AT-cut type quartz crystal plate operating in a thickness shear mode of motion, may be pressure-mounted and clamped between clamping lands, the clamping lands being so proportioned in area and position with respect to the surface of the crystal body as to control the temperature-frequency characteristics of the clamped crystal unit and thereby prevent shifts in the This is frequency crystal frequency resulting from forces due to differential thermal conditions obtaining between the crystal body and its associated mounting members due to ambient temperature changes applied thereto. A feature of interest is that certain different force-frequency effects have been found to exist along different axes of AT-cut, BT-cut and other types of crystal bodies, and that these effects may be utilized in cooperation with, the size and position of the clamping lands in contact therewith in order to nullify the components of such force-frequency effects on the crystal body and thereby render the crystal body substantially free from frequency changes resulting from forces due to differential thermal con ditions applied to the crystal body by the clamping lands, as produced by changes in the magnitude and direction of the flow of heat applied thereto.

In accordance with this invention the temperature-frequency characteristics of a crystal unit in which the crystal element has rigid constraints fixed to its surface, the hysteresis loop area of the temperature-frequency curve of the second kind may be controlled and reduced to substantially zero. For this purpose, the clamping areas may be proportioned with respect to the opposite frequency change effects that have been found to exist along the two mutually perpendicular axes of the crystal faces which in the case of an AT- cut type quartz crystal plate may be the mutually perpendicular Z and X axes, the areas of con tact between the mounting members and the piezoelectric body having an area and position such that the effect of th component of force along the direction of the X axis of the crystal plate nullifies the effect of the component of the force along the direction of the Z axis of the crystal plate, and the areas of contact being pref erably positioned near the axis of the crystal plate which has the smallest temperature coefficient of expansion and which in the case of an AT-cut quartz plate may be the Z axis referred to.

The mounting members, which may be utilized to support the clamping lands, may be composed of a suitable ceramic material such as Steatite F66 or Alsimag 243. Steatite F56 is a type of steatite ceramic material as described in Patent No. 2,332,343 issued October 19, 1943, to M. D. Rigterink (Example 1), assigned to Bell Telephone Laboratories, Incorporated. Alsimag 243 is a type of ceramic material as described in Tele- Tech, February 1947, Low-Loss Ceramic Dielectric by Hans Thurnauer, and in Bulletin of American Ceramics Society, vol. 26, No. 3, March 1947 page by Hans Thurnauer. The latter has a temperature coefficient of expansion which is almost double that of the former and which is almost matched or equal to the temperature coefficient of expansion. of an AT-cut type quartz plate along the direction of the Z axis ther of referred to, and hence may be advantageously utilized with clamping lands thereon to clamp such a crystal plate along the Z axis referred to with but little resulting frictional slipping force applied to the crystal plate when the unit is subjected to temperature changes. Alternatively, the electrode members may be composed of other types of material which has a thermal expansion and composition matching that of the piezoelec tric crystal element mounted therebetween. For example, the clamping electrode members ma be composed cf crystal quartz which in the case of use with an AT-cut type quartz piezoelectric vibrator, may also -be AT-cut quartz clamping electrode members sooriented in the assembled unit that the X axes of the clamping electrodes and the piezoelectric plate therebetween are all aligned with respect to eachother thereby to obtain a matching of .the temperature coefficients of expansion for all directions of thermal expansion along the faces of the vibratory crystal plate. In such .a matched quartz arrangement, the quartz electrode members may be provided with any suitabl clamping lands thereon such as four pairs of oppositely disposed peripheral clamping lands, or two pairs of such clamping lands positioned along therX axis or along the Z axis of the electrode, members.

Where the mountingmembers are composed of insulating material which does not entirely match the piezoelectric crystal plate in respect to the matter of equal temperature coeflicients of thermal expansion, steps may be taken to insure that the frictional slipping force'will be uniform and the clamping lands may be proportioned and positioned with respect to theopposite frequency change effects found along the'directions of ,mutually perpendicular axes of the clamped crystal faces, which in'the case of an AT-cut quartz plate maybe the Z axis and the X or Xaxis.

The frictional forces between the piezoelectric crystal plate and'its clamping lands may be reduced to a point where the mounting may not materially affect the temperature-frequency characteristics of thte piezoelectric crystal plate by such expedients as making the piezoelectric crystal plate surfaces as smooth as possible in the regions of contact with the clamping lands, by

polishing the contact surfaces of the lands and by reducing the clamping pressure to a point that just insures contact of the clamping-lands with the piezoelectric crystal body clamped therebetween.

Another feature of interest is that the temperature gradient effect may itself, if desired, be controlled to be of large value and repetitious, in that an almost vertical shift in the frequency of the crystal body may be effected by small reverses from increasing to decreasing temperatures or Vice versa applied to the crystal unit, if the forces. due to thermal differences are made large and uniform, as for example by making the clamping pressure large, and applying it along the direction of the axis of large frictional slippage, as along the X axis in the caseof an AT-cut type-quartz crystal plate; or by attaching-to the surface of the crystal plate a material having either a zero temperature expansion coefficient or a thermal coefficient large in relation to that of the AT-cut type quartz crystal plate. In this latter instance, the mounting material may be fashioned similar in, shape to the insulating discs described hereinafter except that the raised lands attaching the materialto the crystal plate may be a cement holding firml the material to the crystal plate .at the areas and position on the plate otherwise occupied by the raised lands. The cement may be hard and cause the surface of the material to be specially separated from the surface of the crystal plate.

While the invention is described and illustrated herein particularly in connection with AT-cut quartz plates, it will be understood that it may be utilized in connection with similar effects in other forms of quartz plates or other forms of piezoelectric crystal substances. Also, while the invention is described and illustrated herein particularly in connection with AT-cut quartz plates, in which the contact. between the mounting members and quartz plate gives risev to slipping frictional fcrcesas. the onlyform of the forces due to the differential thermal conditions, it will be understoodthat the inventionmay be utilized in connection with any means formounting the piezoelectric quartz plate that imposes upon the plate forces clue to differential thermal conditions, including forces imposed when the mounting member are attached rigidly and directly to the surface of the crystal plate, the. invention being realized by proportioning the area of contact between the mounting member and the piezoelectric body and by positioning the area of contact.

For a; clearer understanding of the nature of this inventio and the additional advanta es, features and objects thereof, reference is made to the following description taken in connection with the accompanying drawing, in which like reference characters represent like or similar parts and in which:

Fig. 1 is an enlarged sectional view illustrating a eneral assembly arrangement for a piezoelectric crystal unit of the pressure type;

Fig. 2 is an enlarged exploded perspective view illustrating the crystal andelectroded mounting assembly part of the general assembly shown in Fig. 1;

Fig. 3 is an enlarged major face view of the piezoelectric crystal plate of Figs. 1 ancl;2, illustrating particularly a circular shaped AT-cut type quartz crystal plate having itsmutually perpendicular X and Z axes along the major faces th eof;

Fig. 4is an enlarged inner major face view of each of the pair of similar electroded mounting members shown in Figs. 1 and 2, as provided with two raised metallic clamping lands extending arcuately along the periphery thereof and having an axis ee;

Fig. 4A is an enlarged inner major face view of each of the pair of similar electroded mounting members shown in Figs. 1 and 2, as provided with four raised metallic lands circular in shapeand symmetrically disposed about axis ee at an angle 0.

Fig. 5 is an enlarged inner major face view of each of the pair of similar electrcded mounting members shown in Figs. 1 and 2, but provided with four symmetrical raised metallic clamping lands, instead of two lands as illustrated in Fig. 4;

Fig. 6 is a graph illustrating an example of the temperature-frequency hysteresis loop occurring in crystal units as a result of frictional forces applied to the crystal element when taken through a heating and cooling temperature cycle;

Fig. '7 is a graph illustrating the relation between the coeflicient of frictional effect am and the value of the angle ,8 of Fig. 3;

Fig. 8 is a graph illustrating the relation between the differential linear expansion a and the value of the angle ,Bof Fig. 3; and

Fig. 9 is a graph illustrating the relation between the frictional effectaF and the value of the angle {3 of Fig. 3.

Referring to the drawing, Fig. 1 is a greatly enlarged view in section of a pressure type crystal unit comprising a piezoelectric crystal element l which may be in the form of a thin circular shaped quartz crystal disc or plate held between a pair of circular shaped electroded mounting membersfi and 3. The mounting members 2 and ;.3; may comprise similar ceramic, quartz or other suitable insulating discs having the same or nearly the same diameter as that of the piezoelectric crystal disc I, the electroded members 2 and 3 being provided on their inner major faces with oppositely disposed peripheral metallic coatings 30 adapted for pressure-clamping the periphery of the crystal disc I therebetween and also with oppositely disposed central coatings 3i adapted for applying an electric field to the central region of the crystal disc I.

As illustrated in Fig. l, the assembly comprising the piezoelectric crystal disc I and the pair of associated electroded members 2 and 3 may be resiliently held in compression by means of a suitable spring 5 disposed in contact with an electrode terminal coating 34 disposed on the outer major surface of the member 2 and a suitable contact bracket I disposed in contact with the electrode terminal coating 34 disposed on the outer major surface of the member 3. The spring 5 and the bracket I may be individually carried by and mounted on the inner ends of two coaxially disposed pins or rods 9 and I I respectively. The support pins 9 and II may be composed of metal rods and may extend through suitable openings in the central part of each of two glass or other suitable insulating seals I3 which may be inserted in the opposite end openings of metal covers I5 and II respectively of a cylindrical shaped metal casing IS. The end covers I5 and Il may be secured to the cylindrical metal case I9 by any suitable means such as by solder joints 2 I which may extend around the entire inner rim of the metal covers I5 and II at points adjacent the outer surface of the metal casing I9. The outermost peripheral edges of the pair of electroded insulating members 2 and 3 and also that of the piezoelectric crystal plate I may be of similar circular form and disposed in loose fitting relation with respect to the inner wall of the cylindrical metal case I9. The outer end portions of the metal rods 9 and II may be coated with silver plating I0, if desired, in order to provide good electrical contact connections with suitable Spring clips or sockets (not shown) in which they may be mounted. Individual electrical connections to the two opposite major faces of the piezoelectric crystal element I may be established through the conductive pins 9 and II, the conductive bracket I, and the conductive spring 5, the spring 5 and the bracket I contacting two suitable conductive or metallic terminal coatings 34 individually connected by metallic coatings 33 'with the respective electric field-producing me tallic coatings 3| formed integral with the central region of the inner major surfaces of each of the pair of similar insulated electroded members 2 and 3.

The contact bracket I may be formed from a suitable circular shaped brass or other metal disc pressed out at its central region into a cup or dish shaped bracket I, as illustrated in edge view in Fig. 1. At its center, the bracket I may be pro vided with a small hole 8 for mounting the bracket I upon the end of the supporting rod II, and the bracket I may be plated with tin, silver or other suitable metal in order to provide good electrical conductivity. The conductive clamping spring 5, an edge view of which is shown in Fig. 1, may be formed from a circular shaped sheet of hardened beryllium copper or from other suitable spring material and after forming the two spiral shaped spring arms 6, the spring 5 may be suitably heat treated and then silver .plated to provide good electrical conductivity. As

shown in Fig. 1, the spring arms 6 of the spring 5 may make direct electrical and mechanical contact with the metallic terminal coating 34 formed integral with the outer major surface of the adjacent insulating member 2 and thereby function to establish electrical connection as well as to apply resilient clamping pressure to the piezoelectric crystal element I which is thereby resiliently clamped between the oppositely disposed raised lands 33 on the electroded members 2 and 3. As shown in Fig. 1, the assembly comprising the pair of metallized insulating members 2 and 3 and the single quartz piezoelectric plate I is mounted between the spring contact 5 and the cup contact I. As illustrated in Fig. 2, the metal deposit 33 in the slot 32 in each of the in-' sulating members 2 and 3 provides electrical continuity from the terminal contact spot 34 on one side thereof to the field producing electrode spot 3I on the other side thereof. The metal lands 30 deposited along the periphery of the insulating members 2 and 3 are made thicker than the central electrode spot 3I in order to provide an air-gap between the central electrode spot 3| and the quartz piezoelectric plate I. The container and general assembly arrangement illustrated in Fig. 1 may be of the types disclosed in application Serial No. 637,662, filed December 28, 1945, by H. Havstad now United States Patent 2,453,435, dated November 9, 1948,- and in application Serial No. 623,150, filed Octo ber 18, 1945, by L. J. La Brie now Patent #2,486,482, dated November 1, 1949. i The piezoelectric crystal element I may be any suitable piezoelectric element such as a thickness shear mode AT-cut or a. BT-cut quartz crystal plate operated at its fundamental or any odd order mechanical harmonic or overtone thereof; Such AT-cut and B-cut quartz crystal plates are disclosed for example in United States Patent 2,218,200 issued October 15, 1940, to Lack, Willard, and Fair. While the present invention is described particularly in connection with an A" cut quartz crystal element I which employs thickness vibrations of the shear type, it will be un derstood that the piezoelectric crystal body I may be of other suitable types of crystal cuts in quartz; or in other piezoelectric substances.

Fig. 2 is an enlarged perspective view illustrating the crystal and electroded members form-' ing part of the general assembly shown in Fig. 1. As illustrated in Figs. 1 and 2, the piezoelectric crystal element I is disposed between the pair of similar electroded members 2 and 3, and the assembly is held in compression by means of a suitable compression force exerted by the springprongs 6 of the clamping spring element 5 as illustrated in Fig. 1. As shown in Figs. 1 and 2, the pair of electroded members 2 and 3 are each provided with a pair of metallic risers or clamp ing lands 30 extending arcuately along the inner peripheral margins of each of the electroded support members 2 and 3 and contacting the respective opposite major faces of the piezoelectric crystal plate I adjacent the peripheral edges thereof, thereby to resiliently clamp the piezo electric body I between the oppositely disposed clamping lands 3!] provided on each of the elec--' troded support members 2 and 3 mounted between the cup contact I and the spring contact 5 as illustrated in Fig. 1. A small but sufficient clamping force may be applied by the spring5 to the major face margins of the piezoelectric crystal element I to prevent its bodily displacement with respect 'to the clamping lands 30 mme "braised silver "cora-tihgs' 3 0 'and" 3 I 110 cr iticaI- thi'eb and nal coatings 34 may have a thickness of about 0.002 inch and a diameter of about 0.25 inch, and may be located concentrically with respect to the circular periphery of each of the insulating discs 2 and 3.

Fig. 3 is an enlarged major face view of the circular shaped piezoelectric crystal disc I illustrated in edge view in Fig. 1 and Fig. 4 is an enlarged inner major face view of each of the pair of similar electroded members 2 and 3, illustrated in sectional edge view in Fig. 1. As illustrated in Fig. 4, each of the insulating disc electroded members 2 and 3 is provided with two peripheral raised clamping lands 30 each having a length of 20 degrees and a symmetrical axis labeled ee. As illustrated in Fig. 4A, each of the insulating disc electroded members 2 and 3 is provided with four peripheral raised clamping lands 30a each having a diameter of about 0.031 inch and each disposed 6 degrees from the axis labeled ee. As illustrated in Fig. 5, each of the insulating disc electroded members 2 and 3 is provided with four peripheral raised clamping lands 30 each having a length of 20 degrees and a symmetrical axis labeled e-e.

As illustrated in Fig. 3, the piezoelectric crystal plate I is an AT-cut type of quartz plate I having known mutually perpendicular X and Z axes. The position of the axis ee of the clamping lands 30 of each electroded members 2 and 3 of Fig. 4 that may be placed in contact with the opposite major faces of the crystal plate I of Fig. 3 is variably indicated in Fig. 3 by the angle 5 between the axes e and X. Thus, the axis e of the clamping lands 30 of both of the electrode members 2 and 3 may be placed along the X axis, or the Z axis or along some other axis intermediate the X and Z axes of the quartz crystal plate I, according to the value of the angle ,8.

Due to differences in thermal expansions of the piezoelectric disc I and the associated contacting electrode discs 2 and 3, frictional slipping forces, produced therebetween as a result of temperature changes, may be imposed along the directions of the major faces of the piezoelectric disc I and operate to change its frequency of vibration. The magnitude of such frictional forces and the resultant change in frequency will depend upon several factors, and has been found to alter the temperature-frequency characteristics of the crystal unit and give temperature-frequency curves having a sort of hysteresis loop effect between the heating and cooling curves. An example of such temperature-frequency curves is illustrated in Fig. 6.

Fig. 6 is a graph illustrating an example of the temperature-frequency characteristics of a particular crystal unit of the type illustrated in Fig. 1 using an AT-cut type quartz crystal disc I and ceramic type electroded mounting members 2 and 3 provided with clamping lands 30 covering nearly the entire periphery thereof. In this example, the electroded members 2 and 3 being composed of material having a thermal expansion different from that of the piezoelectric crystal disc I and having lands clamping the crystal disc I substantially over the full periphery thereof impose frictional forces between the crystal plate I and the ceramic electrodes 2 and 3 that result in changing the frequency of the crystal plate I whenever the unit is subjected to reversals in the direction of the temperature gradient applied thereto, thus giving the hysteresis loop curve illustrated in Fig. 6.

' As shown in Fi 6. the complete temperaturefrequency characteristic curve is composed of a heating curve HI or H2, a cooling curve 01 and C2 and two drift curves A and B. The drift curve indicated by A shows a change in frequency when the applied temperature is reversed from heating to cooling. The drift curve indicated B shows a change in frequency when the applied temperature is reversed from cooling to heating. The heating curve HI shows a lack of retraceability by the existence of the alternate heating curve H2 which occurs when the rate of heating the unit increases. The cooling curve CI shows a lack of retraceability by the existence of the alternate cooling curve C2 which occurs when the rate of cooling the unit increases. The complete temperature-frequency cycle results in a sort of temperature-frequency hysteresis loop given by the heating and cooling curves HI and CI and the drift curves A and B, or by the alternate loop, the heating and cooling curves H2 and C2 and the drift curves A and B. The drift curve also lacks retraceability for the same reason as the heating and cooling curves. The effect on the curve is to modify the portions marked D to have a larger or smaller curvature as the curve B or A approaches its respective associated heating or cooling curve. I

The frequency follows the heating curve during heating, the cooling curve during cooling, and the drift curves A or B whenever the temperature gradient is reversed. The shape of the temperature-frequency curves of the crystal unit depends upon the shape of the natural temperature-frequency curves of the piezoelectric element I per se, upon the shape of the drift curves at A and B according to whether the horizontal or vertical component of the curves A and B is large, and upon the rapidity of the flow of heat into and out of the crystal unit. The effect of the direc tion of heat flow on the vibration of the plate I' is to change the frequency during the time that the direction of heat flow is changed from heat ing to cooling or vice versa. An increase in clamping pressure generally increases the magni tude of the frequency change. The thermal expansion of the materials involved sets up stresses on the piezoelectric body I which change its fre-: quency. Thus, when'the electrode member 2 or 3 extends at a rate different than that of the quartz plate I, a stress tension or compression is set up in the piezoelectric vibrator plate I due to the frictional forces of slipping of one with re-' spect to the other." Such undesired effects in frequency changes may be eliminated or reduced in accordance with this invention and both the heating and cooling curves of Fig. 6 may be made to take the same or nearly the same line follow ing the shape of either the upper or lower curve in Fig. 6.

The magnitude of the frictional slipping forces and the resulting frequency changes in the tem'- perature-frequency characteristics of the crystal unit may be reduced Or controlled by control of such factors as the degree of clamping pressure, the composition of the insulating electrode mem'-' bers 2 and 3 relative to that of the piezoelectric element I, the number of clamping lands 30, the location of the e--e axis of the clamping lands 30 with respect to the X, Z or other major face axis of the piezoelectric body I, and the proportioning of the lengths 20 of the clamping lands 30 with respect to the X or Z axes of the piezoelectric body I and the degree of surface polish of the clamping area of both the lands 30 and crystal plate I. I

r inducing-the magnitadeiofitheimotiommomes' applied to lithe. piezoelectric disc I reduces lthe magnitude of ithe frequency a'x-hanges :in the giiezoeledtizicsdisc it. Alif'tthe rclam'pm pressure exerted byiitheispning iiflf-Eig. 1" uponzthezthree olamped discs 5| '12 :an'dj' :be :increased;ithe tri'etional ior'ces *will becincrea-sed, shut zif reduced, the frictional forces aird=" frequency :changes will :be reduced.

Also; ii the :clamped afa cos @of the piezoelectric :disc I mr of the cclampin'g ilands she zm'ade were; smoothyonif the -cl'amping :lands ml'be composed of soft;aspongy oraresilienhmatiztialgthefrictional fmreesim'ay ib-e 'zrednc'ed iand ithe :resultant frequency-changes in :th ikp'iEZQ'E'IE ctr-1e :plate ;-I due tonfrictional conditions itmay r be correspondingly nedneed.

fllzre magnitude aof the frictional islippingefonces also depends :znpon ethe differences in thermal expamsions-zof tnenthree. clamped ldiscszll, 2 anda,

- ewe "of-the clamping .zla'n'ds so: of both ithezamembers-2.'- an d 3' maytibe tailigmed' with time axis of thezpiezoelectrief plate :I has illustrated; in -I Fi g. 2, in wider toirizeduc'e. nhanges :I-iIl thel/zf requenoymf fibraltionzzdne to teirmerature ehan'iges. is A I-or tih'e i'easor i that the A'I -cut ltypeiquantz metal plate 1: seife'rrel ltoihas :a: minimmttempexalture 'co'eifielehtof iexpansionw-ioi about v 928 along; the

dineotionlof its Z" axis,' asshomparedwith about 1 3:4 along the direction of IX'oraX axis.

Another iacto afieetingithe magnitude-nimble nd Tits"ETGGLUBDCYAO FVibI'ZilGR is the' oomposition of: the eleotroded imemb'ers- '12 an'dia. "if the -electnoded;meanbtersfixandtfi *b'e :oomposedhfmaterial wlhioh has a thermal expansion 1 recmal zor nearly equal "to that'- oi the piezoelectric: crystal plateit along azselected. :axis .tnereofvand'ifhthe axis ,'B;a0f the clamping 3-9 of themhens z find il 1 be: that seine-ted axis withilittl'e disturbance to :the crystal trecu'enoy deride-temperature:ohange omchangingthadlrociofsheatrflow Ifrlom heating to cooling, :or wine versa.

l Another feature of interest in connection \with this invention #is that the-contact location dimem sion [020i the olamping lands 3-0 may-bepropopti'oned izto 1 control the temperature-frequency characteristics "Of the clamped piezoelectric :c'ryatalmlate l and to obtain la-substantiallyzero hysteiresis .:l'oop sfie'bt win the temperature-frequency curves I :th'ereof. The .dimension =6 'of :the. llandsdfl may be proportioned "to (reduce rtheofriotional efiects mpon the frequency of the; piezoelectric crystal late hi 'vie'w'of: certain iorce-irequen'oy relations obtai rigin the piezoelectric"plate et. For. :eXa-mple fi-i ianaexterna-l force :iS applied to can AT-cut rtype i uartz :crystal plate l parallelltothe majorsiaces- :thereofz and along the direction "of the Xaaxis. or the .Z aXis which is perpendicular to the X sax-is-rthe frequency of thecrystalmlate wilii hez increased :or idec'neased: dependent- Fnpon Whether the :foroe :is s :a-xoompression or :a 'itension applied to the crystahplate l aand'dependentrupon whether the: JfQI-CE is applied along the. direction of dflee X axisor along dihe direction 0f the Z axis. xiMore'xpair ti'en-lanlm in ithe 6858 10f an AlT-cut type (of. quartz :or-ystal :plate ll,-lit.-has been-observed that the-thicknessishearmode fnequen'c'y if athe-tappiiedn oztce .is a :compression along lthe direction of the 1X. axis-.-and *decreas'essi-f-the applied. force fiis za itensiom alon ithe directionrof theiXaxiss, and also that the frequencydeoneases ifithe aappliedizionoe is va compression along the diareetionof the IZ;. axisuaml increases if applied ioroez is a tension along the d'lIHGfiQllIDf the ".Z' "These io'pposite ifiorce-frequermy effects may sbehma'de use :zof :in -connection-with moport'ronl of the dimension :0 of the clampingllandsatllvin order to control the frictional f'r tionai'ifiotoes zapplied zto the piezoelectricfplaite of the crystal plate 4., the 'iriotional'fiorpesidne to 1 temperatime changes-inlay :be. medulla-d. lo-In the ease v:ofmthe ilAfl -icat ltyzpeutctnartz hrystall plate" 1,

degmee'l'eentigrade therielecftrorled members d 'and 3 may be composed of material which matfches'or nearly matches mne: oi wal uesland :used to of a zceramic :materi'al known :in the trade-aas degree pentig-rade-ata temperature "oicabont 25 degrees eventigzvade. lluethermal: expansionszof the Alsimag v24i3 is thenefore about-equal to thaltkofathe it'l ont type quartz plate. :4 :laiong. the

z z'fr- -iaxis theneof and may be conveniemtly utilized fisithe eiectmded members livand 3 cforrclamping lxlls' aned :roi intermediate wtalues between-the 15X and'Z" axes as'rmeasurerl.imparts-per million per forces-and the temperaltu-reefrequencycharacteristios of the :crystalunit.

'"Th'e insulating electroded .:disc 'members :2 :and it; nomposerl iofiramysuitable material :may begpmwidens/1th two pairs oioppositely disposed clampi-ng lands'dhml the :type' illustrated finFigA hath mg" critical =dimensi'ons .1) :made. of "valuesz'suitable toifireduciez tlre-iftemperaturee frequency hysteresis loop to-zero. .f llhe'axis 'ee"of sthezolampingrlands 39 inf-mach oat-the, pair of -electroded membersd and ll m'ay' be; aligned with respect to leaohiother and with respect to the-Z5 axis 'for example Ofdilhfi ATaent: typepiezoelectiic' quartz plate I so that the quartz plate I is clamped by. the two ipfllils of dands it)" along :its Z; axis as illustrated iinJEig. 2; :with itheslengths' 010f the clamping lands--98 being 'so'proportioned that the effect-of thecomponentof frictional :toroe along :the- X axislofsthe citystalz olate -sl millifies the :efiect of thereon:- ponentof tricti'onal force along the Z ax-is of :the quanta plate Lsthere'by. to render the frequency-of the assembled crystal unit substant'mily -free from ohangesxdne: to. frictional 'JfOl'CGS applied to the qmmtz plate :4 stay the lands fillwand resnlting f rom difierenoes in thenma-l expansions -.0fthe quantz plate :l and the clamping electroded meI-nhers 2:;and 3.

.' Asan lillustzative example i in :a particular case out type of quartz orystal disc 1 operatingwinathicknessl-shearlmode of motion at a frequenoy any-where in the-range from about 15 to 5O-lmegaP cycles per second and having awdiametermf about the quartz plate I by means of landsziflgposi-iifl 0i500 sinoh-,-:andr-where the 'two similar eleotroded members 2 and 3 have a diameter about equal to that of the quartz crystal disc I, and are composed of ceramic Steatite F66 discs 2 and 3 each provided with two peripheral lands 30 of the type illustrated in Fig. 4 having an axis e--e aligned along the Z axis of the AT-cut type quartz crystal disc I so that the quartz crystal zdisc I is clamped along its Z axis as illustrated in Fig. 2 and where this arrangement is assembled in a crystal unit of the type illustrated in Fig. 1 and clamped under a pressure of about 10 to 20 ounces by the spring 5, then the dimension of the narrow strip lands 3!! of Fig. 4 may be made to be about 21 degrees in order to obtain a zero or nearly zero temperature-frequency hysteresis loop to thereby render the temperaturefrequency characteristic of the crystal unit substantially constant and free from changes in frequency that would otherwise be produced from changes from reversals from heating to cooling temperatures, or vice versa, applied thereto.

.While a very particular example for the dimenstructed of crystal quartz which may be cut to have the same crystallographic orientation as that of the piezoelectric vibratory element I. In a particular example, three AT-cut type quartz crystal discs I, 2 and 3 of the same shape, size and orientation may be used. the X axis of each of the three quartz crystal discs I, 2 and 3 being aligned with respect to each other so that the thermal expansion of all three discs I, 2 and 3 may be substantially the same in any given direc- .tion parallel to the major faces thereof. In such an arrangement, the quartz crystal electroded members 2 and 3 may be provided with pairs of oppositely disposed clamping lands 30 of the type illustrated in Figs. 4 and 5 having respectively, two or four lands 3!! on each of the electroded members 2 and 3. In the case where the two lands arrangement of Fig. 4 is used, the axis ee thereof as illustrated in Fig. 4 may be along the Z axis thereof so that the pressure clamping forces applied on all three of the quartz crystal discs I, 2 and 3 may be along the Z axis thereof,

which is the axis of minimum thermal expansion for the three AT-cut type quartz crystal discs I,

2 and 3. Alternately, the axis 6-6 of the clamping lands 30 of Fig. 4 instead of being aligned along the Z axis, may be aligned along another axis, such as along the X axis of each of three quartz crystal discs I, 2 and 3.

While the electroded members 2 and 3 have been particularly described herein as being made of ceramic or of quartz material, it will be understood that they may be made of other material, with steps being taken to insure that the frictional slipping forces between the piezoelectric body I and the clamping lands 3!] will be uniform and the clamping lands 30 proportioned with respect to the opposite effects found along the mutually perpendicular Z and X axes of the AT-cut quartz crystal plate I.

The results in the particular example described for proportioning the lands 30 for ceramic F66 type electroded members 2 and 3 may be arrived at by trial or by following a procedure somewhat as follows.

As illustrated in Fig. '7, the frictional forces imposed as a restraint on the freedom of vibration of the crystal plate I may be evaluated by a coefficient of friction that expresses the limiting frictional resistance to relative motion of the clamping land 30 on the surface of the crystal plate I. For a metallic coating of polished silver in contact with a quartz plate finished to have an abrasive texture typical only of 304 emery and then etched in hydrofluoric acid to remove one micron from its thickness, the coefficient of frictional resistance expressed in terms of frequency shift for the AT-cut type crystal blank ma be plotted as am as in Fig. '7 for the angle of location of the lands 30 of 5 degrees from the X axis of the quartz crystal plate I.

As illustrated in Fig. 8, the relative displacement of the clamping lands 30 upon the surface of the crystal plate I may be obtained by evaluating the difference between the temperature coefficient of linear expansion of the crystal plate I along the axis of 13 from the X axis, from the temperature coefficient of linear expansion of the mounting material of the electroded discs I and 2. The evaluation is plotted as a in Fig. 8 for-several mounting materials. A positive value for a indicates that the relative motion of the clamping lands 3!! is away from the center of the disc I and results in a tensile force being imposed upon the vibrations of the crystal plate I along the axis of p from the X axis.

As illustrated in Fig. 9, the evaluation of the frictional effect for a temperature gradient that causes the ambient temperature of the crystal unit to change 2 degrees per minute is plotted as aF for several mounting materials. Empirically, these data are obtained by measuring a at various angles 5 of two clamping lands 30 as in Fig. 4 having a maximum dimension of 0:10 degrees and then measuring the greatest frequency deviation to evaluate am obtained for a constant force F when the temperature of the unit is changed at rates from 1 degree per minute to 15 degrees per minute. The greatest value of a found in this manner may be plotted as am for the particular angle 5. For polished silver lands 30 and a quartz crystal plate I prepared as aforementioned the evaluation of a for a temperature gradient of 2 degrees per minute or less is a=0.1 mm. This empirical result is plotted in Fig. 9 and the frictional frequency deviation given as aF where F is the force of the spring 6 in ounces.

Fig. 9 shows that the clamping land 30 may be shaped as in Fig. 4 and the frequency instability reduced to zero if 0=about 21 degrees for fused quartz electroded members or F66 ceramic electroded members 2 and 3, 0:19 degrees for ceramic Alsimag 243 electroded mounting members 2 and 3 and 0:17 degrees for X quartz electroded mounting members 2 and 3 with the axis e-e of, the electrodes 2 and 3 parallel to the Z' axis of the crystal plate I. The Z quartz electroded mounting member 2 and 3 refers to an AT-cut quartz disc fashioned as an electroded mounting member as in Fig. 4 and with the axis e-e along the Z axis of the material. The X quartz electroded members 2 and 3 are similarly AT-cut quartz but the axis ee is the X' axis of the electrode and crystal plate I of the material. In the case of the Z quartz electroded mounting members 2 and 3, the thermal expansion along all axes will be alike and matched if the e-e axis of the quartz electrodes 2 and 3 is parallel to the Z axis eguce rzs oftlre' crystal= plate It No forces will appear in restraint of.the vibration of the crystal" plate I since there will "be no differential thermal effects. The land lengtl'r' is" m this case" immaterial as longJas the areas of" land disposed on either side ofithe'e -e' axisare equal and-symmetrical about the ee' axis.

9 also shows: that iffa mounting" member 2 01': 3 consists of a pair of' landsBUF'syImnetriCalIy disposedabout thei ax-is=ee"of the member-2 or the area-oft-he pair offlands be totally in cliided within the'emgles 0:7 degrees on either side OftHGiQ- -C' axis; therras the" pair ofelectroded' materials and 3" are rotated"with--respect to the Xaxi's of the crystal plate then at" each anglefi'," as inFig; 8; the total frequency'drift'is'expressed as:"

imwhichifiisin ouncesofspringiorce.and m istl'ie frictional. affect. alongthe; angle. of. it.

Fig; 9r also shows thatrtheelectroded material 2..- and.3tmay; beany' suitable materiallwhatsoever aslong; as. the. clampinglands. are circular. areas 311a,..as in.. Eig,..4A,. anddi'sposedat. an angle. of d=about..1(l degrees from..axis.. e.c andthe discs and. 3, are oriented. immounting, so. that. the Z axis of. the-quartz crystal. plate. I coincideswith the axis, ee.

Fig; Qalsashows that. the. use oilfused quartz electroded members. 2 and, 35with. the. clamping land's 30 of any suitable length and with axis e.-e of. the lands :31]. coincident with the)! axis of theecrystalplate. I r ,thefrequency changesmay. be,- comequite precipitous. with thadriit curve. A. or B' of. 6r-haying.litt1e or; no. curvature. depend: ing; onithe clamping forceoE-'andlwitha temperaturegradientoilessthanz degreesper minute Fig. .9; als dshows. thatthe.sameproportioning. of theolands 3!]...indica1ied by, thelength 0.. aforementionedior. each of.. theelectroded.materialsa z and ilisithe. correct proportion-ingrequired when. thefiee1y.slipping;.metallic. coatings 3.0. are. replaced.

by. a cementing material LS'ILrigidly attaching. .the-

velectnoded';material 2. and .i-Lto. the crystal .plateI. 1

and, thereby. reducing the. frequency.. drift. due. to slipping to. zero .and also. eliminating substantially the lackroiiretraceability when. the. rate on flow oiC heat-into the unit; is varied. clamping length 0 comprises at reiaziorrover.v which the: frequency changes intone. direction are. nullifiedlhy the frequency changesfintheother direetion.

While,.the.matter at propontioning. the dimen- .siens. 0 of the-clamping lands 30, tocontrol'thetemperature-frequency, characteristics oi the crystal,v unit; and; to. reduceto. zero the. temperaturerfr'equency. hysteresis loop has. been described particularly, with. reference. to two. pairs;

ofi'lands li, of the .typeill'ustrated in Fig,;.41.it..will be, understood that similar; results may, be obtained when. the. mounting .members 2 and 3"conof AT-cut quartz crystaleach having four lands. 3'0" disposed as. shown on. Fig. 5 and. the

mountingimembers" Z and 3 are orientated with respect tothe quartzv crystal plate. I in, such. a

manner that:the.X axes ofv thethree discs 'I',. 2

*degreesfoneabovec the'axise-e and'the other. on the opposite end-of" the" e-e:' axis but below it.

I fthe land so" foreshort'ened toth'is' dimension The. critical.-

in applied temperature.

0; then the length: a aforementioned; foreaclT-of th'e'electroded materials-= 2 I and 3 isthe re'quired proportioning with-the axis e-e-ali'g,rredparallel tothe Z"- axisofthe quartz crystal plate I Sim ilar results may" also be obtained if the fore-- shortenedd'and 30 described above is divided into two'- smailer' and equal sections, one section hav me" its" boundary'on" the e-eaxis and the other section having itsiboundary, on the axis 0 degrees from the-'ee axis, the totalarea' of "the'two pairs of"sections"'being' contained in thei'ncluded'- angle betweenithe e-T-e axis" and the axis'iat angler!) t'c'rthe e -e axis:

Also; it willibe-not'edthat the-electrodedmemhers; 2*" and" 3 may be "composed of any"v suitable material 'if theclamping pressure is reduced to a point thatjust insures contact of the lands 30 or 302r'with the .piezoelectricjquartz plate I, and if "the" lands '30 or: 302: be made of polished welladhering sil'vencoatings onithe electroded memibersr'zand 3'; and if "the major. faces "of-the quartz p1ate::I be made as smooth a's.'...possib'le, thereby to" insure: that? the frictional forces; between the clampinglands 3U or"30a;and the quartzplateyl will hezreduc'ed. to a point" wheretemperature changes-may not aifectthe temperature-frequency: characteristiciof' the piezoelectric plate I Alsor, it'will be noted that'th'e electroded'members'-2"'and"3 maybe" composed of any suitable material if there is interposed between the crystalplate I and the l'ands'3'll or; 30a of the electroded' members 2 andis'a thin rubber-like film of 'mat'eria'li that; does not" impede the vibrations of the. crystal plate Ilin piezoelectrieresponse to the voltage" applied to the electrodes '31".

Also itwill be noted" that theelectroded memhers-"2' and 3 maybe composed ofany suitable material if the clamping lands' 3Uarare' made .i as circular: areas as illustrated in Fig. 4A withthe angle "a -about 10 degrees and the discs I, Z and 3 orientated so that" the Z: axis of crystal' disc' I coincides with: the e:-e;axis of the..electroded members"? and- 3. Also it'will be noted that the electroded members 2 and 3 maybe composed of any'suitable material if.a pair of. clampingrlands 3022 are disposed'onan axis1of'0'=10 degrees and the pair' ofl'ands are. circular in shape, or otherwise shaped so that'the areas: on either side of the -0'='1O degree axis are equal and do notex- -tend over an arcuate length of; more than. 'Zdegrees on either sidexofthe 0:10 degree-axis ill.- lustrated in Fig1AA.

Another feature of interest is. that the temperature gradient effect. as illustrated. by the curves'dn. Fig; 6;, may itself be controlledi'to. be

repetitious. and that, if "desired; an almostvertical-"shiftinthe frequency as;.from.the upper. to the-lowercurve in;Fig..6 or vice versa,.may"bie effected in the. crystal. unit with. small reverses For this purpose,,.the clamping pressuremay be made uniform andrelatively large and applied by th clamping lands 30 a1ong ,the axis of maximum thermal. expansion which is the. X'axis. of" an..AT-cutJ type. quartz plate l, f0r example.

Another feature of interest isthat the factors herei'nb'efore. mentioned for controlling, the. temperature-frequency and? the..force.-frequency effects with respect to AT-cutl type quartz plates may als'o be used to controlisimilar efiectsirrBI- cut type quartz plates.- and. in other crystal plates.

While particular. forms: for. the. electroded members. 2 and 3 and for..the.metallic.. coatings '30 and 30wthereon have been described by way 21 of example, it will be understood that other forms may be utilized in accordance with the principles of this invention, and although this invention has been described and illustrated in relation to specific arrangements, it is to be understood that it is capable of application in other organizations and is therefore not to be limited to the particular embodiments disclosed.

piezoelectric quartz crystal body having mutually perpendicular X and Z axes extending along the major faces of said body, and mounting means for said body comprising strips of material disposed in contact with portions of said major faces of said body at regions thereon along said Z axis of said body, said strips each having an angular length transverse to said Z axis of substantially one of the values from 17 to 21 degrees as measured from said Z axis to an extreme end of said strip.

2. Piezoelectric crystal apparatus comprising a piezoelectric quartz crystal body having a pair of neutral axes extending along its major faces and positioned intermediate the mutually perpendicular X and Z axes extending along said major faces of said body, said neutral axes being inclined at angles of substantially degrees with respect to said Z axis on opposite sides thereof, and mounting means for said body comprising spots of material disposed in contact with portions of said major faces of said body at points along and on said neutral axes only of said major faces of said body.

3. Piezoelectric crystal apparatus comprising a piezoelectric crystal body having mutually perpendicular axes extending along its major faces wherein the eifect of compression and tension forces applied along the direction of one of said axes is to increase and decrease respectively the frequency of said body, and oppositely wherein the effect of compression and tension forces applied along the direction of the other of said mutually perpendicular axes is to decrease and increase respectively the frequency of said body, and support means for said body including oppositely disposed lands secured in fixed contact relation with portions of said faces of said body within selected oppositely disposed regions there-- on located along and in predetermined relation with respect to one of said mutually perpendicular axes of said body, said regions for locatin said lands having a selected angular length of one of the values in the range substantially from 10 to 21 degrees as measured transversely from said one of said axes to the extreme end of said respective regions and lands and thereby corresponding to Values substantially nullifying said opposite force-frequency effects obtaining along said mutually perpendicular axes along said faces of said body for rendering said body substantially free from frequency changes resulting from forces applied to said body through said lands due to differences in thermal expansions of said body and said support means.

4. Piezoelectric crystal apparatus in accordance with claim 3, said one of said axes of said body with respect to which said lands are positioned being an axis having substantiall the minimum value of thermal expansion along said faces of said body.

5. Piezoelectric crystal apparatus in accordance with claim 3, said one of said axes with respect to which said lands are positioned being an axis having substantially the minimum value of thermal expansion along said faces of said body, said body being a quartz crystal body having said mutually perpendicular axes, said last-mentioned axes being the X and Z axes along said faces thereof, and said axis of substantially minimum thermal expansion being said Z axis of said body.

6. Piezoelectric crystal apparatus in accordance with claim 3, said axis of said body with respect to which said lands are positioned being an axis having a predetermined value of thermal expansion along said faces of said body, said support means including support members for said lands, said members comprising material having a thermal expansion in the direction of said last-men tioned axis substantially equal to or matching said thermal expansion of said body along said last-mentioned axis thereof.

'7. Piezoelectric crystal apparatus in accordance with claim 3, said axis of said body with respect to which said lands are positioned being an axis having substantially the minimum value of thermal expansion along said faces of said body, said support means including support members for said lands, said members comprising a ceramic material, said body being a quartz crystal body having said mutually perpendicular X and Z axes along said faces thereof, and said axis of substantially minimum thermal expansion being said Z axis of said. body.

8. Piezoelectric crystal apparatus in accordance with claim 3, said support means including support members for said lands, said members comprising an insulating material, and said lands comprising metal coatings formed integral with said support members.

9. Piezoelectric cr stal apparatus in accordance with claim 3, said support means including support members for said lands. said members comprising an insulating material, and said lands comprising metal coatings formed integral with said support members, said metal coatings comprising relatively soft silver coatings adhering to said support members, and said support means constituting pressure-clamping means exerting a clamping pressure just sufficient to insure contact of said relatively soft metal lands with said harder surfaced crystal body.

10. Piezoelectric crystal apparatus comprising a frequency controlling piezoelectric crystal body having mutually perpendicular axes extending along its major faces, a pair of members comprised of insulating material having their inner major surfaces disposed adjacent said opposite major faces of said body, means including oppositely disposed metallic coatings formed integral with said inner major surfaces of said pair of members and spaced by an air-gap in out of contact relation with respect to said opposite major faces of said body for providing an electric field through the central region of said body, support means for said body including a plurality of pairs of oppositely disposed raised lands comprising metallic coatings formed integral with said inner major surfaces of said pair of members and disposed in contact relation with portions of the peripheral region of said opposite major faces of said body for pressure-clamping said body between said lands by said pair of members, said lands being positioned at regions on 23 nositionsainselectedrelation with refillectto said mutually perpendicular axestozthereby constitute means for. substantially nullifying'theefiect-upon saida. frequency: of the component-of,- force along oneiofa saidmutually perpendicular axes with respect tdthat'along; the. other-of said. axes. of. said body resulting from frictional. forces.- applied. to saidbody through: said. lands. due. to.- reversals in temperature gradients appliedrthereto. and there by; constituting means. for rendering. saidbody substantially free. fromfrequency changes result.- ing from..said frictional-forces.applied. to. said body. through said-:1ands..due...to. clifierences in thermal. expansions of. said body. and said. pair. of members.

11 Biezoelectric crystal apparatus. comprising a frequency controlling piezoelectric. crystal body haying. mutually perpendicular axes. extending alongitslmajor. faces, a pair of.,member.s com.- prised. of. insulating-.material having, their inner major. surfaces. disposed. adjacent. said... opposite majortfaces. of. said body, meansinclndingz p: pcsitelydisposed metallic. coatings formed. in.- tegralwithsaidinner major. surfaces of; said pair of.-members and. spaced byan air-gap in out. of contact relationwith respect to... said. opposite major. faces of saidsbody for providingan electricfieldr through the central. regionof. said body, support means for said body. including. a. plurality of; pairs. of oppositely disposed. raised: lands-loomprising metallic. coatingsnformed integral with saidv inner major surfaces. of said .painof. members: and. disposed in. contactrelationwith.pore tions: of the peripheral. regionof said. opposite major faces of said body for pressureeclamping said body, .betweensaid .landsby said pair of members, said lands. being. positioned. at regions-on saidibody inpredetermined-relation with respect toiopp-osite ends of oneof said. axes. of said. body with their areas disposed adjacent. to said. one.

axis. and-on opposite sides thereof. andalcng said peripheral region. of, said major faces of. said body; said-.areasof saidlands being proportioned tmhavedimensions andlocations in. selected. re.-

.lation with respect tosaidmutually perpendicular. axestozthereby constitute. means for. substantially nullifying the effectuponsaid frequency of the-component of. force along one. Of saidmutual- 1y, perpendicular. axeswith respectto that along theother of saidaxes ofsaid. body resulting. from frictional forces appliedto said body throughsa-id landsdue: totreversalss in. temperature gradients applied theretoandtherebyconstituting means for renderingsaid. body substantially free from frequency changesresulting fromsaid frictional I forces.- applied. to said body. through said lands due. to differences in thermal expansions. of said bcdy.- and saidpair of members, said one. axislof said; body being. an. axis having. substantiallyv the minimum value. Of, thermal expansion along; said mai or f aces. of said body.

12.. Piezoelectric; crystal apparatus comprising esfrequency. controlling. piezoelectriccrystal body having, mutually perpendicular. axes. extending tegral with said innermajor surfaces of said-pair oil-members and spaced by an. air-gap in out-of.-

contact. relation with. respect to said. opposite major faces. ofsaid body for. providing. aneIectric field;throughithecentralregion ofsaidbody, support meanstfor said bodyincludingaplurality of pairs 015-; oppositely disposed.v raised landscomprising..metalliccoatings formed integral with saidinnermajor surfaces of said pairofmemberslrand. disposed. in. contact relation withnor.- tions. of; the. peripheral. region. of. said. opposite major facesof. said. body. for pressure-clamping saidbodwbetween said lands by. said pair of members, said lands being-positioned at. regions von said body in predetermined relation with: re-

spect to. opposite ends of. one. ofsaid. axes of said body: with their areas disposed adjacent. to...said one axis and-.on opposite sides thereof. andalong saidperipheral region of saidmajor faces of said body, saidareas-ofsaid landsbeing. proportioned tohave dimensionswand locations in selected relation. withrespect. to. said mutually perpendicular axes to. thereby constitute. means for substantial; 1y nullifying. the. effectupon. said frequency. of the. component of force :along. one ofsaid mutual"- 1y.- perpendicular axes with respect to that along the other of said axes of saidbody. resulting from frictional.. forces. applied to said. body. through saidlandsdue to reversals intemperature gradients. applied. thereto and thereby constituting means-for rendering. said. body substantially free from, frequency changesresulting. from said fricttional-forces applied to said. body through said lands. due. to differencesiinthermal.ex-pansionsof saidrbodyr andsaidipair ofmemberssaid one. axis on said. bodybeing. an. axis...having. substantially the; minimum-value of. thermal. expansion along said. major faces of said..body.,-. said: axis. of. sub.- stantially. minimumthermal. expansion being the Z' axis of said body, and said body, being. an A1.- cut. quartz crystal element. having. mutually perpendicularX-oand Z5 axes along saidmajor faces thereof...

13.. Piezoelectric crystal. apparatus. comprising at-frequency. controlling piezoelectric crystal body having. mutually perpendicular. axes extending along'-.its...-major faces, apair of members comprised -of= insulating material. having. their inner major surfaces. disposedadjacent said opposite major facesofsaidbody, means. including oppositely disposed..metallic coatings formed integral with.v said inner. major surfaces. of said pair of membersand spacedby an air-gap in out of-contact relationwith respect tosaid. opposite major faces-0f. saidbodyfor providing an. electric field through .the. centralregion of said body, support means. for saidbody including a plurality of pairs of: oppositely disposed. raised. lands comprising metalliccoatings formedintegral with said inner major surfaces: of said pair. of. members. and disposed. in. contact relation. with portions. of. the peripheral regionof said opposite. major faces of saidcbody. for pressure-clampingsaid body between. said. lands by. said pair of members, said lands beingpositioned' at regions onsaid body along. axesinclined substantially 10 degrees with respectto one of said mutually perpendicular axesof. saidbody with their areas disposed transversely to. saidl one. axis. and on oppositev sides thereofand along said peripheral region of said major faces of said body,.said areas of said lands being .proportionedto have dimensions and locations corresponding to. values substantially in selectedrelation with respect to saidmutually perpendicular. axes. thereby constituting. means for rendering saidbody substantially free from frequency changes resulting from frictional forces applied. tov said. body through said landsdue to differences. in thermal. expansions of said body and .saidlpair of'members.

14:...1iezoelectric crystal apparatus comprising a piezoelectric crystal body having mutually perpendicular axes extending along its major faces, a pair of members comprised of insulating material having their inner major surfaces disposed adjacent said opposite major faces of said body, means including oppositely disposed metallic coatings formed integral with said inner major surfaces of said pair of members and spaced by an air-gap in out of contact relation with respect to said opposite major faces of said body for providing an electric field through the central region of said body, support means for said body including a plurality of pairs of oppositely disposed raised lands comprising metallic coatings formed integral with said inner major surfaces of said pair of members and disposed in contact relation with portions of the peripheral region of said opposite major faces of said body for pressure-clamping said body between said lands by said pair of members, said lands being positioned at regions on said body adjacent opposite ends of one of said mutually perpendicular axes of said body with their lengths extending transversely to said one axis on opposite sides thereof and along said peripheral region of said major faces of said body, said lengths of said lands being an angular length of one of the values in the range substantially from 1'7 to 21 degrees as measured transversely from said one axis to the remote edge of said respective lands, and thereby being proportioned to have values corresponding to values substantially constituting means for rendering said body substantially free from frequency changes resulting from frictional forces applied to said body through said lands due to differences in thermal expansions of said body and said pair of members, said one axis being the Z axis of said body, and said body being an AT-cut quartz crystal element having said mutually perpendicular axes comprising an X axis and said Z axis.

15. Piezoelectric crystal apparatus comprising a frequency controlling piezoelectric quartz crystal body having mutually perpendicular X and Z axes extending along its major faces, the thickness axis dimension extending between said major faces of said body being made of a value corresponding to the value of said frequency, and support means for said body including a pair of electroded clamping members having a plurality of pairs or oppositely dis-posed raised clamping lands thereon for clamping said major faces of said crystal body adjacent the peripheral region thereof between said pairs of oppositely disposed clamping lands, said clamping lands comprising metallic coatings formed integral with the inner major faces of said pair of clamping members, and said pair of clamping members being comprised of ceramic material, said clamping lands consisting of two pairs of oppositely disposed lands located in selected relation with respect to said X and Z axes and placed substantially along said Z axis only of said crystal body and disposed adjacent said peripheral region thereof with the lengths of said lands extending arcuately across and substantially transversely with respect to said Z axis of said crystal body, said lengths of said lands being proportioned to correspond to values sufficient to constitute means for substantially nullifying the effect upon said frequency of the component of force along said X axis on said crystal body with respect to the opposite effect of the component of force along said Z axis thereof resulting from frictional slipping force produced between said body and said clamping lands due to temperature changes.

16. Piezoelectric crystal apparatus comprising a frequency controlling piezoelectric crystal body having mutually perpendicular X and Z axes along its major plane section, and means including a pair of electroded clamping members having a plurality of pairs of oppositely disposed raised clamping lands thereon for clamping the major faces of said crystal body adjacent the peripheral region thereof between said pairs of oppositely disposed clamping lands, said clamping lands comprising metallic coatings formed integral with the inner major faces of said pair of clamping members, said piezoelectric crystal body being a quartz crystal body, and said pair of clamping members being comprised of quartz crystals having substantially the same crystallographic orientation or cut of quartz as that of said piezoelectric crystal body, the X axis of each of said pair of crystal quartz clamping members being substantially aligned and oppositely disposed with respect to each other, said clamping lands consisting of two pairs of oppositely disposed lands located in selected relation with respect to said X and Z axes and placed along said Z axis of said crystal quartz body with the length dimension of said lands extending substantially transversely with respect to said Z axis, said length dimensions of said lands being proportioned to correspond to values sufficient to constitute means for substantially nullifying the effect upon said frequency of said piezoelectric crystal body of the component of force along said X axis on said piezoelectric crystal body with respect to the opposite effect of the component of the force along said Z axis thereof resulting from frictional slipping force produced between said piezoelectric crystal body and said clamping lands due to temperature changes.

17. Piezoelectric crystal apparatus comprising a piezoelectric crystal plate having mutually perpendicular axes extending along its major faces and having a pair of neutral axes extending along said major faces intermediate said mutually perpendicular axes, and support means for said crystal plate comprising lands disposed in fixed contact relation with portions of said major faces at regions thereon located along, on and in selected positional relation with respect to said neutral axes to thereby constitute means for substantially nullifying the opposite effects upon the frequency of said crystal plate of the components of force along the directions of said mutually perpendicular axes resulting from forces introduced between said crystal plate and said lands due to different thermal expansions in said crystal plate and said support means.

FRANK CAROSELLI.

REFERENCES CITED The following references are of record in the file of this patent:

UNITED STATES PATENTS Number Name Date 2,076,060 Bechmann et al. Apr. 6, 1937 2,343,059 Hight Feb. 29, 1944 FOREIGN PATENTS Number Country Date 490,579 Germany Jan. 30, 1930 

